A possible metrological approach to investigation of the optical properties, material structure and profile shape of compound refractive lenses (CRL) is proposed. The methods of X-ray radiography and electron microscopy are proposed for characterization of the profile of a refractive lens with a small curvature radius. Investigation of the material for problems of X-ray optics is performed using small-angle scattering and X-ray microscopy.

Original Russian Text © I.I. Lyatun, A.Yu. Goikhman, P.A. Ershov, I.I. Snigireva, A.A. Snigirev, 2015, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, 2015, No. 5, pp. 26–30.

https://doi.org/10.1134/S1027451015030076

Citation:

Lyatun, I.I., Goikhman, A.Y., Ershov, P.A. et al. J. Synch. Investig. (2015) 9: 446. https://doi.org/10.1134/S1027451015030076